Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (2007 edition)

This book contains peer-reviewed papers presented at the 2007 International Conference on Frontiers of Characterization and Metrology. It emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics. It provides an effective portrayal of the industry's characterization and metrology needs and how they are being addressed. It also offers a foundation for further advances in metrology and new ideas for research and development. Read More

This book contains peer-reviewed papers presented at the 2007 International Conference on Frontiers of Characterization and Metrology. It emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics. It provides an effective portrayal of the industry's characterization and metrology needs and how they are being addressed. It also offers a foundation for further advances in metrology and new ideas for research and development. Read Less

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2007 2007 edition

ISBN:

0735404410

/ ISBN-13:

9780735404410

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  $107.02 $179.00 Add to Cart Add this copy of Frontiers of Characterization and Metrology for to cart. $107.02, good condition, Sold by BooksRun rated 4.0 out of 5 stars, ships from Philadelphia, PA, UNITED STATES, published 2007 by American Institute of Physics.

  	Edition: 2007, American Institute of Physics Hardcover, Good	Details: ISBN: 0735404410 ISBN-13: 9780735404410 Pages: 578 Edition: 2007 edition Publisher: American Institute of Physics Published: 2007 Language: English Alibris ID: 17587896176	Shipping Options: Standard Shipping: $4.99 Trackable Expedited: $9.99 Two Day Air: $29.99 Choose your shipping method in Checkout. Costs may vary based on destination.
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2007, American Institute of Physics ISBN-13: 9780735404410 2007 edition Unknown binding See All from $107.02