This book/CD-ROM package presents papers from a March 2003 conference on progress in semiconductor technology, detailing major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics. Scientists and engineers conc
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This book/CD-ROM package presents papers from a March 2003 conference on progress in semiconductor technology, detailing major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics. Scientists and engineers conc
Read Less
Add this copy of Characterization and Metrology for Ulsi Technology: to cart. $48.33, good condition, Sold by Phatpocket Limited rated 4.0 out of 5 stars, ships from Waltham Abbey, ESSEX, UNITED KINGDOM, published 2003 by American Institute of Physics.
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Good. Ships from UK in 48 hours or less (usually same day). Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. 100% money back guarantee. We are a world class secondhand bookstore based in Hertfordshire, United Kingdom and specialize in high quality textbooks across an enormous variety of subjects. We aim to provide a vast range of textbooks, rare and collectible books at a great price. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions. We provide a 100% money back guarantee and are dedicated to providing our customers with the highest standards of service in the bookselling industry.
Add this copy of Characterization and Metrology for Ulsi Technology: to cart. $92.25, good condition, Sold by HPB-Red rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 2003 by American Institute of Physics.
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