Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for.../ Materials Physics and Applications)
by Robert McDonald, David G. Seiler, Alain C. Diebold
Add this copy of Frontiers of Characterization and Metrology for to cart. $107.02, good condition, Sold by BooksRun rated 4.0 out of 5 stars, ships from Philadelphia, PA, UNITED STATES, published 2007 by American Institute of Physics.
