Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, July 1 to September 30, 1972 Key wards: Aluminum wire; base transit time; carrier lifetime; die attach ment; electrical properties; epitaxial silicon; gamma - ray detectors; gen eration centers; germanium; gold-doped silicon; infrared response; methods of measurement; microelectronics; microwave diodes; nuclear radiation de tectors; probe techniques (a�c); recombination centers; resistivity; ribbon wire ...
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Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, July 1 to September 30, 1972 Key wards: Aluminum wire; base transit time; carrier lifetime; die attach ment; electrical properties; epitaxial silicon; gamma - ray detectors; gen eration centers; germanium; gold-doped silicon; infrared response; methods of measurement; microelectronics; microwave diodes; nuclear radiation de tectors; probe techniques (a�c); recombination centers; resistivity; ribbon wire bonding; semiconductor devices; semiconductor materials; semiconductor process control; silicon; thermal resistance; trapping centers; ultrasonic bonding; wire bonds. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at ... This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
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All Editions of Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report; October 1 to December 30, 1971 (Classic Reprint)
