Excerpt from Measurement Methods for the Semiconductor Device Industry: A Summary of Nbs Activity; December 1969 Key Words: carrier lifetime; germanium; lithium drifted gamma - ray detectors; resistivity; resistiv ity inhomogeneities; second breakdown; silicon. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at ... This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, ...
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Excerpt from Measurement Methods for the Semiconductor Device Industry: A Summary of Nbs Activity; December 1969 Key Words: carrier lifetime; germanium; lithium drifted gamma - ray detectors; resistivity; resistiv ity inhomogeneities; second breakdown; silicon. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at ... This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
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Add this copy of Measurement Methods for the Semiconductor Device to cart. $14.39, new condition, Sold by Paperbackshop rated 4.0 out of 5 stars, ships from Bensenville, IL, UNITED STATES, published 2018 by Forgotten Books.
