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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition - Goldstein, Joseph, and Newbury, Dale E, and Joy, David C
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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In ...

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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition 2013, Springer, New York, NY

ISBN-13: 9781461349693

3rd 2003

Trade paperback

Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition 2003, Springer, New York, NY

ISBN-13: 9780306472923

3rd Corrected 2003

Hardcover