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0306472929 /
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9780306472923
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Scanning Electron Microscopy and X-Ray Microanalysis
by Joseph Goldstein; Dale E. Newbury; David C. Joy; Charles E. Lyman; Patrick Echlin; Eric Lifshin; Lin
2003, Springer Nature
eBook ISBN:
9780306472923
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Scanning Electron Microscopy and X-Ray Microanalysis Third Edition
by Joseph Goldstein And Dale E. Newbury And David C. Joy And Charles E. Lyman And Patrick Echlin And Eric Lifshin And Linda...
2003, Springer
ISBN-13:
9780306472923
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2003, Springer
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ISBN:
0306472929
ISBN-13:
9780306472923
Edition:
Third Edition; First Printing
Publisher:
Springer
Published:
2003
Language:
English
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17827977070
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Fair with No dust jacket as issued. 0306472929. Stains to exterior edge of pages. Highlighting and notes. Otherwise in good condition.; 689 pages.
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael...
2007, Springer
ISBN-13:
9780306472923
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2007, Springer
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Available Copies: 2
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ISBN:
0306472929
ISBN-13:
9780306472923
Edition:
3rd Corrected 2003
Publisher:
Springer
Published:
04/2007
Language:
English
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17754191434
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Good. US Edition Textbook, May Have Highlights, Notes and/or Underlining, BOOK ONLY-NO ACCESS CODE, NO CD, Ships with Emailed Tracking from USA.
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Michael, J.R.; Sawyer,...
2007, Springer
ISBN-13:
9780306472923
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2007, Springer
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Available Copies: 2
Details:
ISBN:
0306472929
ISBN-13:
9780306472923
Edition:
3rd Corrected 2003
Publisher:
Springer
Published:
04/2007
Language:
English
Alibris ID:
17509688787
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Good. USED-VARIOUS AMOUNTS OF WEAR-POSSIBLE HIGHLIGHTS-WE CANNOT GUARANTEE SUPPLEMENTS SUCH AS CD, ACCESS CODE, OR INFO TRAC.
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
by Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael...
2003, Springer
ISBN-13:
9780306472923
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Add this copy of Scanning Electron Microscopy and X-Ray Microanalysis: to cart. $81.81, new condition, Sold by GridFreed rated 4.0 out of 5 stars, ships from North Las Vegas, NV, UNITED STATES, published 2003 by Springer.
Edition:
2003, Springer
Hardcover,
New
Details:
ISBN:
0306472929
ISBN-13:
9780306472923
Edition:
3rd Corrected 2003
Publisher:
Springer
Published:
01/2003
Language:
English
Alibris ID:
17817115754
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New. Size: 10x7x1; New. In shrink wrap. Looks like an interesting title!
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