Skip to main content alibris logo

Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis

by

Write The First Customer Review
Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis - Goldstein, Joseph (Editor)
Filter Results
Shipping
Item Condition
Seller Rating
Other Options
Change Currency

In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment ...

loading
Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis 2011, Springer, New York, NY

ISBN-13: 9781461344247

Trade paperback

Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis 1975, Springer, New York, NY

ISBN-13: 9780306308208

Hardcover