This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail ...
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This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.
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Add this copy of Applied Scanning Probe Methods to cart. $68.00, very good condition, Sold by Edmonton Book Store rated 4.0 out of 5 stars, ships from Edmonton, AB, CANADA, published 2004 by Springer.
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Very Good. No dustjacket as published. pp. 496, "Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of… 8vo.
Add this copy of Applied Scanning Probe Methods I (Nanoscience and to cart. $98.08, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2004 by Springer.
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Add this copy of Applied Scanning Probe Methods I to cart. $167.55, new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 2004 by Springer.
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New. Sewn binding. Cloth over boards. 476 p. Contains: Unspecified. Nanoscience and Technology. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
