Add this copy of Applied Scanning Probe Methods to cart. $68.00, very good condition, Sold by Edmonton Book Store rated 4.0 out of 5 stars, ships from Edmonton, AB, CANADA, published 2004 by Springer.
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Very Good. No dustjacket as published. pp. 496, "Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of… 8vo.
Add this copy of Applied Scanning Probe Methods I (Nanoscience and to cart. $98.08, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2004 by Springer.
Add this copy of Applied Scanning Probe Methods I to cart. $159.69, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2004 by Springer.
Add this copy of Applied Scanning Probe Methods I to cart. $167.55, new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 2004 by Springer.
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New. Sewn binding. Cloth over boards. 476 p. Contains: Unspecified. Nanoscience and Technology. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
