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Nanoscale Memory Repair - Horiguchi, Masashi, and Itoh, Kiyoo
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Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors' long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as ...

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Nanoscale Memory Repair 2013, Springer, New York, NY

ISBN-13: 9781461427940

2011 edition

Trade paperback

Nanoscale Memory Repair 2011, Springer, New York, NY

ISBN-13: 9781441979575

Hardcover