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Nanoscale Memory Repair - Horiguchi, Masashi, and Itoh, Kiyoo
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Written from years of experience with developing memories and low-voltage CMOS circuits, Nanoscale Memory Repair describes yield and reliability issues in terms of mathematics and engineering. Readers will find a detailed explanation of the various yield models and calculations.

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Nanoscale Memory Repair 2013, Springer, New York, NY

ISBN-13: 9781461427940

2011 edition

Trade paperback

Nanoscale Memory Repair 2011, Springer, New York, NY

ISBN-13: 9781441979575

Hardcover