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Spectroscopic Ellipsometry for the in-Situ Investigation of Atomic Layer Depositions (Paperback Or Softback)
by Sharma, Varun
2015, Grin Verlag
ISBN-13:
9783656923152
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ISBN:
3656923159
ISBN-13:
9783656923152
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4/27/2015
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English
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New in New jacket. Spectroscopic Ellipsometry for the In-situ Investigation of Atomic Layer Depositions (Paperback or Softback)
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Spectroscopic Ellipsometry for the In-situ Investigation of Atomic Layer Depositions
by Sharma, Varun
2015, Grin Verlag
ISBN-13:
9783656923152
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2015, Grin Verlag
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Available Copies: 5
Details:
ISBN:
3656923159
ISBN-13:
9783656923152
Publisher:
Grin Verlag
Published:
2015
Language:
English
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17259305204
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Spectroscopic Ellipsometry for the in-Situ Investigation of Atomic Layer Depositions
by Sharma, Varun
2015, GRIN Verlag
ISBN-13:
9783656923152
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2015, GRIN Verlag
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ISBN:
3656923159
ISBN-13:
9783656923152
Publisher:
GRIN Verlag
Published:
2015
Language:
English
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17576439068
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