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ISBN: 9783540678410
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3540678417 /
ISBN-13:
9783540678410
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Transmission Electron Microscopy and Diffractometry of Materials
by B Fultz Brent Fultz
2001, Springer
ISBN-13:
9783540678410
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Hawthorne,
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$66.11
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Add this copy of Transmission Electron Microscopy and Diffractometry of to cart. $66.11, like new condition, Sold by Media Smart rated 3.0 out of 5 stars, ships from Hawthorne, CA, UNITED STATES, published 2001 by Springer.
Edition: 2001, Springer
Hardcover,
Fine/Like New
Available Copies: 2
Details: ISBN:
3540678417
ISBN-13:
9783540678410
Publisher:
Springer
Published:
2001
Language:
English
Alibris ID:
18183156164
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Transmission Electron Microscopy and Diffractometry of Materials
by James M. Howe
2001, Springer
ISBN-13:
9783540678410
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Bonita
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Newport Coast,
CA,
USA
$129.48
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Add this copy of Transmission Electron Microscopy and Diffractometry of to cart. $129.48, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2001 by Springer.
Edition: 2001, Springer
Hardcover,
Good
Details: ISBN:
3540678417
ISBN-13:
9783540678410
Publisher:
Springer
Published:
2001
Language:
English
Alibris ID:
18230461276
Shipping Options: Standard Shipping: $4.99
Trackable Expedited: $9.99
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Seller's Description: Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
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