Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is ...
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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
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Add this copy of Noncontact Atomic Force Microscopy to cart. $75.00, good condition, Sold by Moe's Books rated 4.0 out of 5 stars, ships from Berkeley, CA, UNITED STATES, published 2002 by Springer.
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Good. No jacket. Ex library with typical labeling on spine, covers, inside front cover. Clean and unmarked inside, light rubbing on corners, one bump to bottom edge of front cover.
Add this copy of Noncontact Atomic Force Microscopy to cart. $206.66, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2002 by Springer.
