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Cmos Gate-Stack Scaling-Materials, Interfaces and Reliability Implications: Volume 1155 (Mrs Proceedings)
by Demkov, Alexander A. Et Al, Eds
2009, Materials Research Society
ISBN-13:
9781605111285
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Add this copy of Cmos Gate-Stack Scaling-Materials, Interfaces and to cart. $9.50, like new condition, Sold by Powell's Books Chicago rated 5.0 out of 5 stars, ships from Chicago, IL, UNITED STATES, published 2009 by Materials Research Society.
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2009, Materials Research Society
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ISBN:
1605111287
ISBN-13:
9781605111285
Publisher:
Materials Research Society
Published:
2009
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English
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17221946321
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Cmos Gate-Stack Scaling? Materials, Interfaces and Reliability Implications: Volume 1155 (Mrs Proceedings)
2009, Cambridge University Press
ISBN-13:
9781605111285
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Add this copy of Cmos Gate-Stack Scaling? Materials, Interfaces and to cart. $39.07, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2009 by Cambridge University Press.
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2009, Cambridge University Press
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ISBN:
1605111287
ISBN-13:
9781605111285
Publisher:
Cambridge University Press
Published:
2009
Language:
English
Alibris ID:
17909602002
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