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ISBN: 9781441932990
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1441932992 /
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9781441932990
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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
by Czanderna, Alvin W. (Editor), and Madey, Theodore E. (Editor), and Powell, Cedric J. (Editor)
2010, Springer-Verlag New York Inc.
ISBN-13:
9781441932990
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Add this copy of Beam Effects, Surface Topography, and Depth Profiling to cart. $159.69, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2010 by Springer-Verlag New York Inc..
Edition: 2010, Springer-Verlag New York Inc.
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Details: ISBN:
1441932992
ISBN-13:
9781441932990
Publisher:
Springer-Verlag New York Inc.
Published:
2010
Language:
English
Alibris ID:
10530891596
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Seller's Description: New. Print on demand Methods of Surface Characterization . XX, 430 p. Intended for professional and scholarly audience.
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Paperback,
New
Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
by Czanderna, Alvin W. (Editor), and Madey, Theodore E. (Editor), and Powell, Cedric J. (Editor)
2010, Springer-Verlag New York Inc.
ISBN-13:
9781441932990
See Item Details ▾
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USA
$178.71
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Add this copy of Beam Effects, Surface Topography, and Depth Profiling to cart. $178.71, new condition, Sold by booksXpress, ships from Bayonne, NJ, UNITED STATES, published 2010 by Springer-Verlag New York Inc..
Edition: 2010, Springer-Verlag New York Inc.
Paperback,
New
Available Copies: 10+
Details: ISBN:
1441932992
ISBN-13:
9781441932990
Publisher:
Springer-Verlag New York Inc.
Published:
2010
Language:
English
Alibris ID:
17917405174
Shipping Options: Standard Shipping: $4.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New. Methods of Surface Characterization . XX, 430 p. Intended for professional and scholarly audience.
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