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ISBN: 9780863417450
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0863417450 /
ISBN-13:
9780863417450
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Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: The System on Chip Approach
by Sun, Yichuang, Professor (Editor)
2008, Institution of Engineering & Technology
ISBN-13:
9780863417450
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Add this copy of Test and Diagnosis of Analogue, Mixed-Signal and RF to cart. $114.41, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2008 by Institution of Engineering & Technology.
Edition: 2008, Institution of Engineering & Technology
Paperback,
New
Available Copies: 10+
Details: ISBN:
0863417450
ISBN-13:
9780863417450
Publisher:
Institution of Engineering & Technology
Published:
2008
Language:
English
Alibris ID:
14590497662
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Seller's Description: New. Trade paperback (US). Glued binding. 416 p. Contains: Unspecified. Materials, Circuits and Devices.
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Paperback,
New
Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: The System on Chip Approach
by Sun, Yichuang, Professor (Editor)
2008, Institution of Engineering & Technology
ISBN-13:
9780863417450
See Item Details ▾
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MERSEYSIDE,
UNITED KINGDOM
$192.96
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Add this copy of Test and Diagnosis of Analogue, Mixed-Signal and RF to cart. $192.96, new condition, Sold by Booksplease rated 3.0 out of 5 stars, ships from Southport, MERSEYSIDE, UNITED KINGDOM, published 2008 by Institution of Engineering & Technology.
Edition: 2008, Institution of Engineering & Technology
Paperback,
New
Available Copies: 5
Details: ISBN:
0863417450
ISBN-13:
9780863417450
Publisher:
Institution of Engineering & Technology
Published:
2008
Language:
English
Alibris ID:
17781396279
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Seller's Description: New. Trade paperback (US). Glued binding. 416 p. Contains: Unspecified. Materials, Circuits and Devices.
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Test and Diagnosis of Analogue, Mixed-Signal and Rf Integrated Circuits: the System on Chip Approach (Materials, Circuits and Devices)
2008, The Institution of Engineering
ISBN-13:
9780863417450
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Newport Coast,
CA,
USA
$202.96
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Add this copy of Test and Diagnosis of Analogue, Mixed-Signal and Rf to cart. $202.96, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2008 by The Institution of Engineering.
Edition: 2008, The Institution of Engineering
Paperback,
Good
Details: ISBN:
0863417450
ISBN-13:
9780863417450
Publisher:
The Institution of Engineering
Published:
2008
Language:
English
Alibris ID:
17884481676
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Seller's Description: Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
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