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Handbook of Charged Particle Optics - Orloff, Jon (Editor)
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This timely handbook contains chapters on the essential elements of high resolution charged particle optics and is written by many of the world's leading research scientists. It is a complete guide to understanding, designing, and using high resolution instrumentation such as transmission electron microscopes (TEMs), scanning electron microscopes (SEMs), scanning transmission electron microscopes (STEMs), and focused ion beam (FIB) systems. This handbook is evenly balanced between theory and application, and covers all the ...

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Handbook of Charged Particle Optics 2008, CRC Press, Oxford

ISBN-13: 9781420045543

2nd edition

Hardcover

Handbook of Charged Particle Optics 1997, CRC Press, Boca Raton, FL

ISBN-13: 9780849325137

Hardcover