This volume contains the proceedings of the 9th International Conference on Secondary Ion Mass Spectrometry (SIMS IX), held in Yokohama, Japan, in November 1993. The contributors explore a range of research issues, from environmental problems to depth profiling and semiconductors.
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This volume contains the proceedings of the 9th International Conference on Secondary Ion Mass Spectrometry (SIMS IX), held in Yokohama, Japan, in November 1993. The contributors explore a range of research issues, from environmental problems to depth profiling and semiconductors.
Read Less
Add this copy of Secondary Ion Mass Spectrometry: Sims IX to cart. $33.69, good condition, Sold by HPB-Red rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 1994 by Wiley.
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Add this copy of Secondary Ion Mass Spectrometry to cart. $34.50, new condition, Sold by Scholars Attic rated 5.0 out of 5 stars, ships from Lake Barrington, IL, UNITED STATES, published 1994 by John Wiley & Sons.
Add this copy of Secondary Ion Mass Spectrometry: Sims IX to cart. $72.35, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 1994 by Wiley.
Add this copy of Secondary Ion Mass Spectrometry: Sims IX to cart. $134.95, very good condition, Sold by Salish Sea Books rated 5.0 out of 5 stars, ships from Bellingham, WA, UNITED STATES, published 1994 by Wiley.
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Very Good++; Hardcover; 1994, John Wiley & Sons Publishing; "Secondary Ion Mass Spectometry, SIMS IX, " by Benninghoven et. al.; Inside of book is like new.
Add this copy of Secondary Ion Mass Spectrometry: Sims IX to cart. $139.95, very good condition, Sold by Salish Sea Books rated 5.0 out of 5 stars, ships from Bellingham, WA, UNITED STATES, published 1994 by Wiley.
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Very Good; Hardcover; 1994, John Wiley Publishing; Minor shelfwear to covers; Pages clean & unmarked; Good binding; 1008 pages; "Secondary Ion Mass Spectrometry: SIMS IX, " by A. Benninghoven, et al.
