Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Add this copy of Advances in Imaging and Electron Physics: Optics of to cart. $52.01, like new condition, Sold by Amazingbookdeals rated 5.0 out of 5 stars, ships from NEW DELHI, DL, INDIA, published 2010 by Academic Press.
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![Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers (Volume 161) (Advances in Imaging and Electron Physics, Volume 161) [Hardcover] Hawkes, Peter W.](https://www2.alibris-static.com/isbn/9780123813183_t.gif)
