Edition
ISBN:
904817855X /
ISBN-13:
9789048178551
Book Details
Seller
Sort
Seller Rating
Price: Low to High
Price: High to Low
Condition
Condition: Reverse
Pub Date
Pub Date: Reverse
Sellers Near Me
Paperback,
New
Cmos Sram
by Pavlov
2010, Springer
ISBN-13:
9789048178551
See Item Details ▾
discount_scientific_books
AVERAGE
Sterling Heights,
MI,
USA
$26.66
Add to Cart
Add this copy of Cmos Sram to cart. $26.66, new condition, Sold by discount_scientific_books rated 3.0 out of 5 stars, ships from Sterling Heights, MI, UNITED STATES, published 2010 by Springer.
Edition: 2010, Springer
Paperback,
New
Available Copies: 2
Details: ISBN:
904817855X
ISBN-13:
9789048178551
Publisher:
Springer
Published:
2010
Language:
English
Alibris ID:
18223221691
Shipping Options: Standard Shipping: $4.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: Brand New. New Book Paperback International edition, We Ship to PO BOX Address also.
Hide Details ▴
Paperback,
New
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test
by Pavlov, Andrei, and Sachdev, Manoj
2010, Springer
ISBN-13:
9789048178551
See Item Details ▾
Alibris
BEST
NV, USA
$169.08
Add to Cart
Add this copy of CMOS SRAM Circuit Design and Parametric Test in Nano to cart. $169.08, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2010 by Springer.
Edition: 2010, Springer
Paperback,
New
Available Copies: 10+
Details: ISBN:
904817855X
ISBN-13:
9789048178551
Publisher:
Springer
Published:
2010
Language:
English
Alibris ID:
10538072426
Shipping Options: Standard Shipping: $4.99
Trackable Expedited: $9.99
Two Day Air: $29.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New. Frontiers in Electronic Testing . XVI, 194 p. Intended for professional and scholarly audience.
Hide Details ▴
Paperback,
Good
Cmos Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test (Frontiers in Electronic Testing, 40)
by Pavlov, Andrei
2010, Springer
ISBN-13:
9789048178551
See Item Details ▾
Bonita
HIGH
Newport Coast,
CA,
USA
$191.81
Add to Cart
Add this copy of Cmos Sram Circuit Design and Parametric Test in Nano to cart. $191.81, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2010 by Springer.
Edition: 2010, Springer
Paperback,
Good
Details: ISBN:
904817855X
ISBN-13:
9789048178551
Publisher:
Springer
Published:
2010
Language:
English
Alibris ID:
18181462124
Shipping Options: Standard Shipping: $4.99
Trackable Expedited: $9.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
Hide Details ▴
