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Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
by Sadewasser, Sascha (Editor), and Glatzel, Thilo (Editor)
2018, Springer
ISBN-13:
9783319756868
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3319756869
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Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
by Sadewasser, Sascha (Editor), and Glatzel, Thilo (Editor)
2018, Springer
ISBN-13:
9783319756868
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3319756869
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2018 edition
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Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
2018, Springer
ISBN-13:
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Details: ISBN:
3319756869
ISBN-13:
9783319756868
Edition:
2018 edition
Publisher:
Springer
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2018
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English
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