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3030092984 /
ISBN-13:
9783030092986
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Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
by Sadewasser, Sascha (Editor), and Glatzel, Thilo (Editor)
2019, Springer
ISBN-13:
9783030092986
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Add this copy of Kelvin Probe Force Microscopy: From Single Charge to cart. $206.66, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2019 by Springer.
Edition: 2019, Springer
Paperback,
New
Available Copies: 10+
Details: ISBN:
3030092984
ISBN-13:
9783030092986
Publisher:
Springer
Published:
2019
Language:
English
Alibris ID:
15158873096
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Seller's Description: New. Print on demand Trade paperback (US). Glued binding. 521 p. Contains: Unspecified, Illustrations, black & white, Illustrations, color, Tables, color. Springer Surface Sciences, 65.
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