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Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
by Dahoo, Pierre-Richard, and Pougnet, Philippe, and El Hami, Abdelkhalak
2021, Wiley-Iste
ISBN-13:
9781786306401
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Details: ISBN:
1786306409
ISBN-13:
9781786306401
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Wiley-Iste
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2021
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Hardcover,
New
Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
by Dahoo, Pierre-Richard, and Pougnet, Philippe, and El Hami, Abdelkhalak
2021, Wiley-Iste
ISBN-13:
9781786306401
See Item Details ▾
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Edition: 2021, Wiley-Iste
Hardcover,
New
Available Copies: 10+
Details: ISBN:
1786306409
ISBN-13:
9781786306401
Publisher:
Wiley-Iste
Published:
2021
Language:
English
Alibris ID:
18251767099
Shipping Options: Standard Shipping: $4.99
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Seller's Description: New. Sewn binding. Cloth over boards. 256 p.
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