Edition
ISBN:
0471739065 /
ISBN-13:
9780471739067
Book Details
Seller
Sort
Seller Rating
Price: Low to High
Price: High to Low
Condition
Condition: Reverse
Pub Date
Pub Date: Reverse
Sellers Near Me
Very Good
Semiconductor Material and Device Characterization
by Schroder Dieter K.
2005, Wiley-IEEE Press
ISBN-13:
9780471739067
See Item Details ▾
FirstClassBooks
HIGH
Little Rock,
AR,
USA
$74.00
$218.95
Add to Cart
Add this copy of Semiconductor Material and Device Characterization to cart. $74.00, very good condition, Sold by FirstClassBooks rated 4.0 out of 5 stars, ships from Little Rock, AR, UNITED STATES, published 2005 by Wiley-IEEE Press.
Edition: 2005, Wiley-IEEE Press
Very Good
Available Copies: 5
Details: ISBN:
0471739065
ISBN-13:
9780471739067
Edition:
3rd edition
Publisher:
Wiley-IEEE Press
Published:
2005
Language:
English
Alibris ID:
18064640813
Shipping Options: Standard Shipping: $4.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: Very Good. Used books cannot guarantee unused access codes or working CD's! !
Hide Details ▴
Hardcover,
Good
Semiconductor Material and Device Characterization
by Schroder, Dieter K.
2015, Wiley-IEEE Press
ISBN-13:
9780471739067
See Item Details ▾
Bonita
HIGH
Newport Coast,
CA,
USA
$118.29
$218.95
Add to Cart
Add this copy of Semiconductor Material and Device Characterization to cart. $118.29, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2015 by Wiley-IEEE Press.
Edition: 2015, Wiley-IEEE Press
Hardcover,
Good
Details: ISBN:
0471739065
ISBN-13:
9780471739067
Edition:
3rd edition
Publisher:
Wiley-IEEE Press
Published:
2015
Language:
English
Alibris ID:
17903295123
Shipping Options: Standard Shipping: $4.99
Trackable Expedited: $9.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
Hide Details ▴
Hardcover,
New
Semiconductor Material and Device Characterization
by Schroder, Dieter K.
2015, Wiley-IEEE Press
ISBN-13:
9780471739067
See Item Details ▾
Orange World
LOW
mundelein,
IL,
USA
$138.16
$218.95
Add to Cart
Add this copy of Semiconductor Material and Device Characterization to cart. $138.16, new condition, Sold by Orange World rated 2.0 out of 5 stars, ships from mundelein, IL, UNITED STATES, published 2015 by Wiley-IEEE Press.
Edition: 2015, Wiley-IEEE Press
Hardcover,
New
Details: ISBN:
0471739065
ISBN-13:
9780471739067
Edition:
3rd edition
Publisher:
Wiley-IEEE Press
Published:
06/2015
Language:
English
Alibris ID:
18253209770
Shipping Options: Standard Shipping: $4.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New. Size: 6x2x9; New. There is a slight shelf or time wear. Otherwise new.
Hide Details ▴
Hardcover,
New
Semiconductor Material and Device Characterization
by Schroder, Dieter K.
2015, Wiley-IEEE Press
ISBN-13:
9780471739067
See Item Details ▾
Just one more Chapter
not rated
Miramar,
FL,
USA
$144.43
$218.95
Add to Cart
Add this copy of Semiconductor Material and Device Characterization to cart. $144.43, new condition, Sold by Just one more Chapter, ships from Miramar, FL, UNITED STATES, published 2015 by Wiley-IEEE Press.
Edition: 2015, Wiley-IEEE Press
Hardcover,
New
Details: ISBN:
0471739065
ISBN-13:
9780471739067
Edition:
3rd edition
Publisher:
Wiley-IEEE Press
Published:
2015
Language:
English
Alibris ID:
18252634661
Shipping Options: Standard Shipping: $4.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New.
Hide Details ▴
Hardcover,
Good
Semiconductor Material and Device Characterization
by Schroder, Dieter K.
2015, Wiley-IEEE Press
ISBN-13:
9780471739067
See Item Details ▾
TEXTSHUB
BEST
Franklin Lakes,
NJ,
USA
$154.05
$218.95
Add to Cart
Add this copy of Semiconductor Material and Device Characterization to cart. $154.05, good condition, Sold by TEXTSHUB rated 5.0 out of 5 stars, ships from Franklin Lakes, NJ, UNITED STATES, published 2015 by Wiley-IEEE Press.
Edition: 2015, Wiley-IEEE Press
Hardcover,
Good
Available Copies: 2
Details: ISBN:
0471739065
ISBN-13:
9780471739067
Edition:
3rd edition
Publisher:
Wiley-IEEE Press
Published:
06/2015
Language:
English
Alibris ID:
17754258330
Shipping Options: Standard Shipping: $4.99
Trackable Expedited: $9.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: Good. Textbook, May Have Highlights, Notes and/or Underlining, BOOK ONLY-NO ACCESS CODE, NO CD, Ships with Tracking.
Hide Details ▴
Hardcover,
Good
Semiconductor Material and Device Characterization
by Schroder, Dieter K.
2015, Wiley-IEEE Press
ISBN-13:
9780471739067
See Item Details ▾
Book Words
HIGH
Midland Park,
NJ,
USA
$158.28
$218.95
Add to Cart
Add this copy of Semiconductor Material and Device Characterization to cart. $158.28, good condition, Sold by Book Words rated 4.0 out of 5 stars, ships from Midland Park, NJ, UNITED STATES, published 2015 by Wiley-IEEE Press.
Edition: 2015, Wiley-IEEE Press
Hardcover,
Good
Available Copies: 2
Details: ISBN:
0471739065
ISBN-13:
9780471739067
Edition:
3rd edition
Publisher:
Wiley-IEEE Press
Published:
06/2015
Language:
English
Alibris ID:
18222515233
Shipping Options: Standard Shipping: $4.99
Trackable Expedited: $9.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: Good. USED-VARIOUS AMOUNTS OF WEAR-POSSIBLE HIGHLIGHTS-WE CANNOT GUARANTEE SUPPLEMENTS SUCH AS CD, ACCESS CODE, OR INFO TRAC.
Hide Details ▴
Hardcover,
Very Good
Semiconductor Material and Device Characterization
by Schroder, Dieter K.
2015, Wiley-IEEE Press
ISBN-13:
9780471739067
See Item Details ▾
Book Words
HIGH
Midland Park,
NJ,
USA
$160.97
$218.95
Add to Cart
Add this copy of Semiconductor Material and Device Characterization to cart. $160.97, very good condition, Sold by Book Words rated 4.0 out of 5 stars, ships from Midland Park, NJ, UNITED STATES, published 2015 by Wiley-IEEE Press.
Edition: 2015, Wiley-IEEE Press
Hardcover,
Very Good
Available Copies: 2
Details: ISBN:
0471739065
ISBN-13:
9780471739067
Edition:
3rd edition
Publisher:
Wiley-IEEE Press
Published:
06/2015
Language:
English
Alibris ID:
18222560677
Shipping Options: Standard Shipping: $4.99
Trackable Expedited: $9.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: Very Good. USED-VARIOUS AMOUNTS OF WEAR-POSSIBLE HIGHLIGHTS-WE CANNOT GUARANTEE SUPPLEMENTS SUCH AS CD, ACCESS CODE, OR INFO TRAC.
Hide Details ▴
Hardcover,
New
Semiconductor Material and Device Characterization
by Schroder, Dieter K.
2015, Wiley-IEEE Press
ISBN-13:
9780471739067
See Item Details ▾
GridFreed
HIGH
North Las Vegas,
NV,
USA
$170.53
$218.95
Add to Cart
Add this copy of Semiconductor Material and Device Characterization to cart. $170.53, new condition, Sold by GridFreed rated 4.0 out of 5 stars, ships from North Las Vegas, NV, UNITED STATES, published 2015 by Wiley-IEEE Press.
Edition: 2015, Wiley-IEEE Press
Hardcover,
New
Details: ISBN:
0471739065
ISBN-13:
9780471739067
Edition:
3rd edition
Publisher:
Wiley-IEEE Press
Published:
06/2015
Language:
English
Alibris ID:
16627988987
Shipping Options: Standard Shipping: $4.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description: New. Size: 102x31x150; New. In shrink wrap. Looks like an interesting title!
Hide Details ▴
