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System-On-Chip Test Architectures: Nanometer Design for Testability Volume .
by Wang, Laung-Terng, and Stroud, Charles E, and Touba, Nur A
2007, Morgan Kaufmann Publishers
ISBN-13:
9780123739735
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System-on-Chip Test Architectures: Nanometer Design for Testability (Volume. ) (Systems on Silicon, Volume. )
by Wang, Laung-Terng
2007, Morgan Kaufmann
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9780123739735
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System-on-Chip Test Architectures: Nanometer Design for Testability (Volume. ) (Systems on Silicon, Volume. )
by Wang, Laung-Terng
2007, Morgan Kaufmann
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9780123739735
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012373973X
ISBN-13:
9780123739735
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