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Secondary Ion Mass Spectrometry - Benninghoven, A (Editor), and Nihei, Y (Editor), and Shimizu, R (Editor)
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Consists of over 200 papers by acknowledged experts in their specialized fields. Offers a superlative overview of current research and technology in diverse areas running the gamut from environmental problems to depth profiling and semiconductors.

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Secondary Ion Mass Spectrometry 1994, Wiley

ISBN-13: 9780471942184

Hardcover