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Reliability and Degradation of III-V Optical Devices

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Reliability and Degradation of III-V Optical Devices - Ueda, Osamu
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Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.

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Reliability and Degradation of III-V Optical Devices 1996, Artech House Publishers, Boston, MA

ISBN-13: 9780890066522

Hardcover