Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization

Presents the applications of Kelvin probe force microscopy in nanotechnology Provides an in-depth description of a variety of theoretical and experimental aspects of the technique Includes contributions by the leading experts in the field Read More

Presents the applications of Kelvin probe force microscopy in nanotechnology Provides an in-depth description of a variety of theoretical and experimental aspects of the technique Includes contributions by the leading experts in the field Read Less

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  	This is a digital edition of this title. Rent eBook (5 Options) 30 Day Rental: $62.70 (Expires Mar 18, 2025) 60 Day Rental: $83.60 (Expires Apr 17, 2025) 90 Day Rental: $104.50 (Expires May 17, 2025) 120 Day Rental: $125.40 (Expires Jun 16, 2025) 180 Day Rental: $135.85 (Expires Aug 15, 2025) Buy eBook Lifetime Access: $209.00 Title: Kelvin Probe Force Microscopy by Sascha Sadewasser Publisher: Springer Nature Print ISBN: 9783319756868, 3319756869 eText ISBN: 9783319756875 Edition: 2018 2018 edition Format: EPUB eBook	$62.70 Rent eBook This is a digital eBook Nothing will be shipped to you Works with web browsers and the VitalSource app on all Windows, Mac, Chromebook, Kindle Fire, iOS, and Android devices Most eBooks are returnable within 14 days of purchase Questions? See our eBook FAQ