Thin films based upon organic materials are at the heart of much of the revolution in modern technology, from advanced electronics, to optics to sensors to biomedical engineering. This volume in the Materials Characterization series introduces the major common types of analysis used in characterizing of thin films and the various appropriate characterization technologies for each. Materials such as Langmuir-Blodgett films and self-assembled monolayers are first introduced, followed by analysis of surface properties and the ...
Read More
Thin films based upon organic materials are at the heart of much of the revolution in modern technology, from advanced electronics, to optics to sensors to biomedical engineering. This volume in the Materials Characterization series introduces the major common types of analysis used in characterizing of thin films and the various appropriate characterization technologies for each. Materials such as Langmuir-Blodgett films and self-assembled monolayers are first introduced, followed by analysis of surface properties and the various characterization technologies used for such. Readers will find detailed information on: -Various spectroscopic approaches to characterization of organic thin films, including infrared spectroscopy and Raman spectroscopy -X-Ray diffraction techniques, High Resolution EELS studies, and X-Ray Photoelectron Spectroscopy -Concise Summaries of major characterization technologies for organic thin films, including Auger Electron Spectroscopy, Dynamic Secondary Ion Mass Spectrometry, and Transmission Electron Microscopy (TEM).
Read Less
Add this copy of Characterization of Organic Thin Films (Materials to cart. $16.81, very good condition, Sold by Book Alley rated 4.0 out of 5 stars, ships from Pasadena, CA, UNITED STATES, published 1994 by Newnes.
Add this copy of Characterization of Organic Thin Films (Materials to cart. $18.28, very good condition, Sold by Suffolk Books rated 4.0 out of 5 stars, ships from center moriches, NY, UNITED STATES, published 2010 by Momentum Press.
Add this copy of Characterization of Organic Thin Films (Materials to cart. $19.30, very good condition, Sold by Zubal Books rated 5.0 out of 5 stars, ships from Cleveland, OH, UNITED STATES, published 2010 by Momentum Press.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
276 pp., Hardcover, very good. -If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
Add this copy of Characterization of Organic Thin Films (Materials to cart. $45.44, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 1994 by Newnes.
Add this copy of Characterization of Organic Thin Films to cart. $75.39, new condition, Sold by Media Smart rated 4.0 out of 5 stars, ships from Hawthorne, CA, UNITED STATES, published 2010 by Momentum Press.
Add this copy of Characterization of Organic Thin Films (Hb 2010) to cart. $76.55, good condition, Sold by Books International rated 4.0 out of 5 stars, ships from Toronto, ON, CANADA, published 2010 by Momentum Press.
Add this copy of Characterization of Organic Thin Films to cart. $98.36, new condition, Sold by discount_scientific_books rated 4.0 out of 5 stars, ships from Sterling Heights, MI, UNITED STATES, published 2010 by Momentum Press.
