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Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties

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Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties - Dahoo, Pierre-Richard, and Pougnet, Philippe, and El Hami, Abdelkhalak
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To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the principles of quantum mechanics. This book presents experimental methods enabling the development and characterization of materials at the nanometer scale, based on practical engineering cases, such as 5G and the interference of polarized light when applied ...

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Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties 2021, Wiley-Iste

ISBN-13: 9781786306401

Hardcover