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Reliability of Rohs-Compliant 2d and 3d Ic Interconnects

by John H. Lau

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    • Title: Reliability of Rohs-Compliant 2d and 3d Ic Interconnects by John H. Lau
    • Publisher: McGraw-Hill Professional
    • Print ISBN: 9780071753791, 0071753796
    • eText ISBN: 9780071753807
    • Edition: 2010 1st edition
    • Format: EPUB eBook
    $131.40
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