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Active Probe Atomic Force Microscopy
by Fangzhou Xia
2024, Springer
ISBN-13:
9783031442322
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Details: ISBN:
3031442326
ISBN-13:
9783031442322
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2024
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Active Probe Atomic Force Microscopy: a Practical Guide on Precision Instrumentation
2024, Springer
ISBN-13:
9783031442322
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Details: ISBN:
3031442326
ISBN-13:
9783031442322
Edition:
2024 edition
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Springer
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2024
Language:
English
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18181646336
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