Add this copy of Characterization Methods for Submicron Mosfets to cart. $159.69, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2011 by Springer.
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Seller's Description:
New. Print on demand Trade paperback (US). Glued binding. 232 p. Contains: Unspecified. The Springer International Engineering and Computer Science, 352.
Add this copy of Characterization Methods for Submicron Mosfets to cart. $199.46, new condition, Sold by Media Smart rated 4.0 out of 5 stars, ships from Hawthorne, CA, UNITED STATES, published 2011 by Springer.
