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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics)
by Pietsch, Ullrich; Holy, Vaclav; Baumbach, Tilo
2011, Springer
ISBN-13:
9781441923073
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ISBN:
1441923071
ISBN-13:
9781441923073
Edition:
2nd edition 2004
Publisher:
Springer
Published:
12/2011
Language:
English
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17790620017
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics)
by Pietsch, Ullrich
2011, Springer
ISBN-13:
9781441923073
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Edition:
2011, Springer
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Details:
ISBN:
1441923071
ISBN-13:
9781441923073
Edition:
2nd edition 2004
Publisher:
Springer
Published:
2011
Language:
English
Alibris ID:
17335194142
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Standard Shipping: $4.99
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