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Testing and Reliable Design of CMOS Circuits (1990 edition)

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Testing and Reliable Design of CMOS Circuits - Jha, Niraj K, and Kundu, Sandip
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In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance ments in this area pose many new problems in the area of testing. Testing has become a very time-consuming process. In order to ease the ...

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Testing and Reliable Design of CMOS Circuits 2011, Springer, New York, NY

ISBN-13: 9781461288183

Trade paperback

Testing and Reliable Design of CMOS Circuits 1989, Springer, New York, NY

ISBN-13: 9780792390565

1990 edition

Hardcover