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ISBN: 9780387400907
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0387400907 /
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9780387400907
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Scanning Probe Microscopy
by Adam Foster Werner A. Hofer
2006, Springer
ISBN-13:
9780387400907
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ISBN:
0387400907
ISBN-13:
9780387400907
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Springer
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2006
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English
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16631371092
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Scanning Probe Microscopy
by Foster
2006, Springer
ISBN-13:
9780387400907
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2006, Springer
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ISBN:
0387400907
ISBN-13:
9780387400907
Edition:
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Springer
Published:
2006
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English
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18014214944
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Scanning Probe Microscopy: Atomic Scale Engineering By Forces and Currents
by Foster
2006, Springer
ISBN-13:
9780387400907
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2006, Springer
New
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ISBN:
0387400907
ISBN-13:
9780387400907
Edition:
and edition
Publisher:
Springer
Published:
2006
Language:
English
Alibris ID:
18014280110
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Scanning Probe Microscopy: Atomic Scale Engineering By Forces and Currents (Nanoscience and Technology)
by Foster, Adam; Hofer, Werner A.
2006, Springer
ISBN-13:
9780387400907
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2006, Springer
Hardcover,
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ISBN:
0387400907
ISBN-13:
9780387400907
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Springer
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06/2006
Language:
English
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16844363951
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New. Size: 9x6x0; New. In shrink wrap. Looks like an interesting title!
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Scanning Probe Microscopy, Atomic Scale Engineering By Forces and Currents
2006, Springer
ISBN-13:
9780387400907
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Edition:
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Available Copies: 2
Details:
ISBN:
0387400907
ISBN-13:
9780387400907
Edition:
and edition
Publisher:
Springer
Published:
2006
Language:
English
Alibris ID:
17945116577
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Brand New. New Book Original US edition, We Ship to PO BOX Address also.
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