Books
ISBN: 9780367400637
Edition
ISBN:
0367400634 /
ISBN-13:
9780367400637
Book Details
Seller
Sort
Seller Rating
Price: Low to High
Price: High to Low
Condition
Condition: Reverse
Pub Date
Pub Date: Reverse
Sellers Near Me
Paperback,
New
High Resolution X-Ray Diffractometry And Topography
by Bowen, D.K., and Tanner, Brian K.
2019, CRC Press
ISBN-13:
9780367400637
See Item Details ▾
Booksplease
HIGH
Southport,
MERSEYSIDE,
UNITED KINGDOM
$100.90
Add to Cart
Add this copy of High Resolution X-Ray Diffractometry And Topography to cart. $100.90, new condition, Sold by Booksplease rated 4.0 out of 5 stars, ships from Southport, MERSEYSIDE, UNITED KINGDOM, published 2019 by CRC Press.
Edition:
2019, CRC Press
Paperback,
New
Details:
ISBN:
0367400634
ISBN-13:
9780367400637
Publisher:
CRC Press
Published:
2019
Language:
English
Alibris ID:
17163823735
Shipping Options:
Standard Shipping: $4.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
New. Intended for professional and scholarly audience.
Hide Details ▴
Paperback,
New
High Resolution X-Ray Diffractometry And Topography
by Bowen, D.K., and Tanner, Brian K.
2019, CRC Press
ISBN-13:
9780367400637
See Item Details ▾
Ria Christie Books
HIGH
Uxbridge,
MIDDLESEX,
UNITED KINGDOM
$104.88
Add to Cart
Add this copy of High Resolution X-Ray Diffractometry And Topography to cart. $104.88, new condition, Sold by Ria Christie Books rated 4.0 out of 5 stars, ships from Uxbridge, MIDDLESEX, UNITED KINGDOM, published 2019 by CRC Press.
Edition:
2019, CRC Press
Paperback,
New
Available Copies: 10+
Details:
ISBN:
0367400634
ISBN-13:
9780367400637
Publisher:
CRC Press
Published:
2019
Language:
English
Alibris ID:
18319656666
Shipping Options:
Standard Shipping: $4.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
New. Intended for professional and scholarly audience.
Hide Details ▴
Paperback,
Good
High Resolution X-Ray Diffractometry and Topography
by Bowen, D.K.
2019, CRC Press
ISBN-13:
9780367400637
See Item Details ▾
Bonita
HIGH
Santa Clarita,
CA,
USA
$124.32
Add to Cart
Add this copy of High Resolution X-Ray Diffractometry and Topography to cart. $124.32, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2019 by CRC Press.
Edition:
2019, CRC Press
Paperback,
Good
Details:
ISBN:
0367400634
ISBN-13:
9780367400637
Publisher:
CRC Press
Published:
2019
Language:
English
Alibris ID:
18137377059
Shipping Options:
Standard Shipping: $4.99
Trackable Expedited: $9.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
Hide Details ▴
Paperback,
New
High Resolution X-Ray Diffractometry and Topography
by Bowen, D.K.
2019, CRC Press
ISBN-13:
9780367400637
See Item Details ▾
Bonita
HIGH
Santa Clarita,
CA,
USA
$163.22
Add to Cart
Add this copy of High Resolution X-Ray Diffractometry and Topography to cart. $163.22, new condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Santa Clarita, CA, UNITED STATES, published 2019 by CRC Press.
Edition:
2019, CRC Press
Paperback,
New
Available Copies: 2
Details:
ISBN:
0367400634
ISBN-13:
9780367400637
Publisher:
CRC Press
Published:
2019
Language:
English
Alibris ID:
18137377060
Shipping Options:
Standard Shipping: $4.99
Trackable Expedited: $9.99
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
New.
Hide Details ▴