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Thoughtful Machine Learning: A Test-Driven Approach

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Thoughtful Machine Learning: A Test-Driven Approach - Kirk, Matthew
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Learn how to apply test-driven development (TDD) to machine-learning algorithms--and catch mistakes that could sink your analysis. In this practical guide, author Matthew Kirk takes you through the principles of TDD and machine learning, and shows you how to apply TDD to several machine-learning algorithms, including Naive Bayesian classifiers and Neural Networks. Machine-learning algorithms often have tests baked in, but they can't account for human errors in coding. Rather than blindly rely on machine-learning results ...

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Thoughtful Machine Learning: A Test-Driven Approach 2014, O'Reilly Media

ISBN-13: 9781449374068

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