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Thermal-Aware Testing of Digital VLSI Circuits and Systems

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Thermal-Aware Testing of Digital VLSI Circuits and Systems - Chattopadhyay, Santanu
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This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips

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Thermal-Aware Testing of Digital VLSI Circuits and Systems 2020, CRC Press, London

ISBN-13: 9780367607098

Paperback

Thermal-Aware Testing of Digital VLSI Circuits and Systems 2018, CRC Press Inc, Bosa Roca

ISBN-13: 9780815378822

Hardcover