This book is t e fifth in aseries of scientific textbooks designed to cover advances in selected research fields from a basic and general view- point. The reader is taken carefully but rapidly through the introductory material in order that t e significance of recent developments can be understood with only limited initial knowledge. The inclusion in the Appendix of the abstracts of many of the more important papers in the field provides further assistance for the non-specialist, and acts as aspringboard to supplementary ...
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This book is t e fifth in aseries of scientific textbooks designed to cover advances in selected research fields from a basic and general view- point. The reader is taken carefully but rapidly through the introductory material in order that t e significance of recent developments can be understood with only limited initial knowledge. The inclusion in the Appendix of the abstracts of many of the more important papers in the field provides further assistance for the non-specialist, and acts as aspringboard to supplementary reading for those who wish to consult the original liter- ature. Surface analysis has been the subject of numerous books and review articles, and the fundamental scientific principles of t e more popular techniques are now reasonably weIl established. This book is concerned with the very powerful techniques of Auger electron and X-ray photoelectron spectroscopy (AES and XPS), with an emphasis on how they may be performed as part of a modern analytical facility. Since the development of AES and XPS in the late 1960s and early 1970s there have been great strides forward in the sensitivities and resolutions of the instrumentation. Simultaneously, these spectroscopies have undergone a veritable explosion, both in their acceptance alongside more routine ana1ytical techniques and in the range of problems and materials to which they are applied. As a result, many researchers in industry and in academia now come into contact with AES and XPS not as specialists, but as users.
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Add this copy of Surface Analysis By Electron Spectroscopy: Measurement to cart. $45.23, good condition, Sold by Phatpocket Limited rated 4.0 out of 5 stars, ships from Waltham Abbey, ESSEX, UNITED KINGDOM, published 1994 by Springer.
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Add this copy of Surface Analysis by Electron Spectroscopy: Measurement to cart. $103.32, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 1994 by Springer.
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New. Sewn binding. Cloth over boards. 156 p. Contains: Unspecified. Updates in Applied Physics and Electrical Technology. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Surface Analysis by Electron Spectroscopy: Measurement to cart. $116.09, like new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 1994 by Springer.
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Fine. Sewn binding. Cloth over boards. 156 p. Contains: Unspecified. Updates in Applied Physics and Electrical Technology. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.