This book constitutes the refereed proceedings of the 22nd International Static Analysis Symposium, SAS 2015, held in Saint-Malo, France, in September 2015. The 18 papers presented in this volume were carefully reviewed and selected from 44 submissions. All fields of static analysis as a fundamental tool for program verification, bug detection, compiler optimization, program understanding, and software maintenance are addressed, featuring theoretical, practical, and application advances in the area
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This book constitutes the refereed proceedings of the 22nd International Static Analysis Symposium, SAS 2015, held in Saint-Malo, France, in September 2015. The 18 papers presented in this volume were carefully reviewed and selected from 44 submissions. All fields of static analysis as a fundamental tool for program verification, bug detection, compiler optimization, program understanding, and software maintenance are addressed, featuring theoretical, practical, and application advances in the area
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Add this copy of Static Analysis: 22nd International Symposium, SAS 2015 to cart. $51.64, new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 2015 by Springer-Verlag Berlin and Heidelberg GmbH & Co. K.
Edition:
2015, Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Publisher:
Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Published:
2015
Language:
English
Alibris ID:
17987806025
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Add this copy of Static Analysis: 22nd International Symposium, SAS 2015 to cart. $51.65, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2015 by Springer-Verlag Berlin and Heidelberg GmbH & Co. K.
Edition:
2015, Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Publisher:
Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Published:
2015
Language:
English
Alibris ID:
16232007575
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New. Print on demand Contains: Illustrations, black & white. Theoretical Computer Science and General Issues ; Lecture Notes in Computer Science . XVI, 333 p. 90 illus. Intended for professional and scholarly audience.
