Software Process and Product Measurement: International Conferences IWSM 2008, MetriKon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008, Proceedings
Software Process and Product Measurement: International Conferences IWSM 2008, MetriKon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008, Proceedings
Since 1990 the International Workshop on Software Measurement (IWSM)has beencelebratedannuallyalternatingbetweenMontr??? eal(Canada)andvariouscities acrossGermany.TheMontr??? ealeditionshavebeenorganizedbytheSoftwareEn- 1 ??? gineeringResearchLaboratory(GELOG) oftheEcoledetechnologiesup??? erieure- Universit???eduQu??? ebec, whichisdirectedbyProf.AlainAbran.TheGermaneditions 2 havebeenorganizedjointlybytheSoftwareMeasurementLaboratory(SMLAB) ofthe Otto vonGuerickeUniversityMagdeburg(Germany), whichis directedby Prof.Reiner ...
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Since 1990 the International Workshop on Software Measurement (IWSM)has beencelebratedannuallyalternatingbetweenMontr??? eal(Canada)andvariouscities acrossGermany.TheMontr??? ealeditionshavebeenorganizedbytheSoftwareEn- 1 ??? gineeringResearchLaboratory(GELOG) oftheEcoledetechnologiesup??? erieure- Universit???eduQu??? ebec, whichisdirectedbyProf.AlainAbran.TheGermaneditions 2 havebeenorganizedjointlybytheSoftwareMeasurementLaboratory(SMLAB) ofthe Otto vonGuerickeUniversityMagdeburg(Germany), whichis directedby Prof.Reiner R. Dumke; and the Germanassociationfor software metrics and ef- 3 fortestimation(DASMAe.V.), whichisledbyManfredBundschuhandGun ] ter B] uren.ThebiennialeditionsofIWSMinGermanyhasbeenheldjointlywiththe 4 DASMASoftwareMetricsCongress(MetriKon) since2002.MetriKonisayearly event, conductedeveryotheryearforaGerman-speakingaudienceatchanging- tionallocationsforbest-practicesharingofsoftwaremeasurementtopics, bringing thebestandrenownedGerman-speakingexpertsofthe?eldtogether. The?rsttwoeditionsoftheInternationalConferenceonSoftwareProcessand 5 Product Measurement(Mensura) were organizedby Juan J. Cuadrado-Gallego from the University of Alcal??? a (Spain) and convened in C??? adiz (Spain) in 2006 together with IWSM in Palma de Mallorca (Spain) in 2007. To foster research, practiceandexchangeofexperiencesandbestpracticesinsoftwareprocessesand product measurement, the 2008 editions of IWSM / MetriKon / Mensura were combined. The conferences were held during November 18-20, 2008 in Munich (Germany) and kindly hosted by Siemens AG. ThisvolumecomprisestheproceedingsofIWSM/MetriKon/Mensura2008 and consistsofthe ?nal paperspresentedat these joint events.Eachone of these papers has been thoroughly revised and extended in order to be accepted for publication. The IWSM / MetriKon / Mensura Steering Committee is proud to have-once more-obtainedthe approvalof Springer to publish the second edition of the joint conference proceedings in the prestigiousLecture Notes in Computer Science (LNCS) series. We hope to maintain this collaboration for the future editions of these joint events.
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