A description of the field of scanning electron microscopy and X-ray microanalysis, including coverage of specimen preparation, electron emission, lenses and electromagnetic fields, specimen-beam interactions, vacuum generation, and energy and wavelength dispersive X-ray spectroscopy.
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A description of the field of scanning electron microscopy and X-ray microanalysis, including coverage of specimen preparation, electron emission, lenses and electromagnetic fields, specimen-beam interactions, vacuum generation, and energy and wavelength dispersive X-ray spectroscopy.
Read Less
Add this copy of Scanning Electron Microscopy and X-Ray Microanalysis to cart. $55.59, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 1992 by Prentice Hall.
