This invaluable resource tells the complete story of failure mechanisms--from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that ...
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This invaluable resource tells the complete story of failure mechanisms--from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.
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Add this copy of Reliability Wearout Mechanisms in Advanced CMOS to cart. $109.99, like new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 2009 by Wiley-IEEE Press.
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Fine. Sewn binding. Cloth over boards. 640 p. Contains: Unspecified, Tables, black & white, Diagrams, Figures. IEEE Press Microelectronic Systems. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Reliability Wearout Mechanisms in Advanced Cmos to cart. $110.00, very good condition, Sold by Spike706 rated 5.0 out of 5 stars, ships from Poughkeepsie, NY, UNITED STATES, published 2009 by Wiley-IEEE Press.
Add this copy of Reliability Wearout Mechanisms in Advanced Cmos to cart. $130.24, Sold by Books International rated 3.0 out of 5 stars, ships from Toronto, ON, CANADA, published 2009 by Wiley-IEEE Press.
