This book provides a comprehensive introduction to patent policy, law and practice in Greater China and will be a go-to book for patent practitioners who have client interests in that region.Features: Introduction to Chinese patent policy. Detailed coverage of technology transfer and substantive patent law in China, including prerequisites for protection, exceptions and limitations. Practical analysis of patent law relating to 3 specific fields of invention: employee inventions, biotechnological and pharmaceutical ...
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This book provides a comprehensive introduction to patent policy, law and practice in Greater China and will be a go-to book for patent practitioners who have client interests in that region.Features: Introduction to Chinese patent policy. Detailed coverage of technology transfer and substantive patent law in China, including prerequisites for protection, exceptions and limitations. Practical analysis of patent law relating to 3 specific fields of invention: employee inventions, biotechnological and pharmaceutical inventions, and software inventions. Overview of the patent application and examination procedure, with a particular view on PCT applications. Insight into specific characteristics of enforcement mechanisms and jurisprudence in China, including the dual enforcement system, claim interpretation, infringement types, and invalidity procedures. Invaluable section on the relationship between patent and antitrust law, including practical realities in the sphere of anticompetitive licensing. Overviews of the patent systems of Chinese Taipei, Hong Kong SAR and Macau SAR Edited by two leading patent experts, and written by a team of experienced practitioners from China and from Europe, offering insight rarely brought together in a single place. This book will be an indispensable reference work for lawyers, patent attorneys and other practitioners interested in learning whether and how to protect patents in China. Contributors: C. Bailey, Y. Bu, J. Cao, W. Chen, D. Clark, G. Cui, C. Czychowski, M. Deng, P. Ganea, H. Goddar, N. Heide, S.-H. Lee, J. Li, Y. Li, K.-C. Liu, S. Luginbuehl, Q. Ma, T. Mak, J.B. Nordemann, T. Pattloch, O. Pfaffenzeller, B. Roth, C.D. Sim???es, L. Wang, B. Weibel
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