The papers published in these peer-reviewed proceedings represent the latest developments in nondestructive characterization of materials and were presented at the Tenth International Symposium on Nondestructive Characterization of Materials held on June 26 - 30, 2000 in Karuizawa, Japan. The symposium was held concurrently with three other symposia and one workshop. This symposium is the tenth in the series that began in 1983 and became an international meeting in 1986. The symposium started with a Plenary Lecture ...
Read More
The papers published in these peer-reviewed proceedings represent the latest developments in nondestructive characterization of materials and were presented at the Tenth International Symposium on Nondestructive Characterization of Materials held on June 26 - 30, 2000 in Karuizawa, Japan. The symposium was held concurrently with three other symposia and one workshop. This symposium is the tenth in the series that began in 1983 and became an international meeting in 1986. The symposium started with a Plenary Lecture entitled 'Application of Non-contact Ultrasonics to Nondestrctive Characterization of Materials' by Professor R.E. Green, Jr. Various characterization methods were presented at the symposium, including ultrasonics, X-ray, eddy currents, laser, thermal wave, acoustic emission, optical fibers, optics, magnetics and ultrasonic microscope. Thin films and coatings as well as smart materials were also emphasized in this symposium.
Read Less
Add this copy of Nondestructive Characterization of Materials X to cart. $94.65, like new condition, Sold by Zubal Books rated 5.0 out of 5 stars, ships from Cleveland, OH, UNITED STATES, published 2001 by Elsevier Science.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
436 pp., Hardcover, handstamps to front endpaper and pastedown, else fine. -If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
Add this copy of Nondestructive Characterization of Materials X to cart. $158.14, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2001 by Elsevier Science.
Add this copy of Nondestructive Characterization of Materials X: to cart. $182.63, new condition, Sold by Paperbackshop rated 4.0 out of 5 stars, ships from Bensenville, IL, UNITED STATES, published 2001 by Elsevier Science.
Add this copy of Nondestructive Characterization of Materials X: to cart. $228.88, new condition, Sold by Revaluation Books rated 4.0 out of 5 stars, ships from Exeter, DEVON, UNITED KINGDOM, published 2001 by Elsevier Science.
Add this copy of Nondestructive Characterization of Materials X to cart. $242.15, new condition, Sold by Booksplease rated 4.0 out of 5 stars, ships from Southport, MERSEYSIDE, UNITED KINGDOM, published 2001 by Elsevier Science.