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Monte Carlo Modeling for Electron Microscopy and Microanalysis - Joy, David C
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This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the ...

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Monte Carlo Modeling for Electron Microscopy and Microanalysis 1995, Oxford University Press, USA, New York, NY

ISBN-13: 9780195088748

Annotated

Hardcover