Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the field of length and distance metrology. Within the book advanced solutions, which can be used for various applications and can help provide a comprehensive understanding of both metrology and interferometry, have been developed and discussed.
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Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the field of length and distance metrology. Within the book advanced solutions, which can be used for various applications and can help provide a comprehensive understanding of both metrology and interferometry, have been developed and discussed.
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Add this copy of Modern Interferometry for Length Metrology: Exploring to cart. $160.03, new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 2018 by Institute of Physics Publishing.
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